Paper
13 March 2018 Targeted removal of metallic contamination from lithography solvents using membrane purifiers
Aiwen Wu, Tetsu Kohyama, James Hamzik, Saksatha Ly, Jad Jaber
Author Affiliations +
Abstract
Metal ions in photoresists and solvents pose an ever greater contamination problem in photolithography’s advanced applications. The reduction of metal contaminants is critical in the entire photochemical supply chain. In this paper we demonstrate that two novel membrane purifiers dramatically reduced the metal contents in a range of organic solvents. These solvents are used for photoresist manufacturing and for wafer surface and dispense line rinse in track tools. The impact of flow rate and metal concentrations in the feed on the metal removal efficiency of the purifiers is presented. Furthermore, a study to determine the dominant mechanism of metal reduction in solvents is proposed.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aiwen Wu, Tetsu Kohyama, James Hamzik, Saksatha Ly, and Jad Jaber "Targeted removal of metallic contamination from lithography solvents using membrane purifiers", Proc. SPIE 10586, Advances in Patterning Materials and Processes XXXV, 1058618 (13 March 2018); https://doi.org/10.1117/12.2297395
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Metals

Ions

Lithography

Contamination

Adsorption

Photoresist materials

Semiconducting wafers

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