The role of texturing in x-ray diffraction tomography

Joel A. Greenberg; Chris MacGibbon; Dean Hazineh; Brian Keohane; Scott Wolter

doi:10.1117/12.2303620

4 May 2018 The role of texturing in x-ray diffraction tomography

Joel A. Greenberg, Chris MacGibbon, Dean Hazineh, Brian Keohane, Scott Wolter

Proceedings Volume 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III; 106320B (2018) https://doi.org/10.1117/12.2303620
Event: SPIE Defense + Security, 2018, Orlando, FL, United States

Abstract

Concealed threat detection is a challenging task that requires a high degree of material specificity. X-ray diffraction tomography (XRDT) offers a solution to the problem, but may at times be too sensitive to the details and history of a given sample. One example of this effect arises in the dependence of the measured scatter signal to the orientation of the sample relative to the beam, which we refer to generally as texturing. To better understand texturing in real world materials and imaging scenarios, we develop two experimental systems for measuring scatter and create databases of the resulting scatter form factors over a range of energies and angles. We then use this data to develop a simulation tool to model XRDT systems in the presence of textured materials and analyze the results. While texturing introduces complications to accurate imaging of an object, we find that choices in the measurement strategy can mitigate these effects and improve performance.

Citation Download Citation

Joel A. Greenberg, Chris MacGibbon, Dean Hazineh, Brian Keohane, and Scott Wolter "The role of texturing in x-ray diffraction tomography", Proc. SPIE 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III, 106320B (4 May 2018); https://doi.org/10.1117/12.2303620

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