Paper
5 June 2018 Ultra-broadband perfect absorber based on successive nano-Cr-film
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Abstract
We have designed and experimentally demonstrated a periodic multilayer structure of SiO2 and Cr thin interlayers to achieve an ultra-broadband perfect absorber based on optical admittance matching method. The successive Nano-Cr-film make significant contribution to improving the absorption intensity of the structure. Measurements reveal high absorption over 85%, when averaged over the range 0.4–7.2 μm. Remarkably, it is the most broadband planar absorber film without involving lithography in fabrication. Incident angle and polarization dependence of the absorption spectra are also considered. The manufactured absorber also has potential applications for thermal shielding, detecting, imaging, photovoltaics (PVs), sensing, etc.
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Hongfei Jiao, Xinshang Niu, Xuemin Zhang, Jinlong Zhang, Xinbin Cheng, and Zhanshan Wang "Ultra-broadband perfect absorber based on successive nano-Cr-film", Proc. SPIE 10691, Advances in Optical Thin Films VI, 106911S (5 June 2018); https://doi.org/10.1117/12.2313133
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Cited by 1 scholarly publication.
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KEYWORDS
Absorption

Metals

Chromium

Dielectrics

Multilayers

Reflectivity

Transmittance

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