CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10703 > Article
Paper
12 July 2018 EMCCD in-situ periodic characterization in Shack-Hartmann wavefront sensor for GTCAO
Óscar Tubío Araújo, Miguel Núñez Cagigal, Ruben Thor Wenzel Argüelles, Roberto López López, Roberto Luis Simoes, José Marco de la Rosa, Icíar Montilla, Jesús Patrón Recio, Marta Puga Antolín, Marcos Reyes García-Talavera, Luis Fernando Rodríguez Ramos, Josefina Rosich Minguell, Victor J. S. Béjar, Alastair Basden
Author Affiliations +
Proceedings Volume 10703, Adaptive Optics Systems VI; 107034W (2018) https://doi.org/10.1117/12.2312641
Event: SPIE Astronomical Telescopes + Instrumentation, 2018, Austin, Texas, United States
Abstract
The Gran Telescopio Canarias Adaptive Optics (GTCAO) will measure the wavefront with a Shack-Hartmann sensor. This wavefront sensor (WFS) is based on the CCD220, an electron-multiplying CCD (EMCCD) that achieves sub-electron readout noise, increasing the signal to noise ratio when weak natural guide stars (NGS) are used as reference. GTCAO will start its operation in telescope with NGS, using only one wavefront sensor, and later it will incorporate a Laser Guide Star (LGS) and consequently a second WFS, also based on an EMCCD. Both EMCCDs and a third one used as spare, have been characterized and compared including the system gain, electron- multiplication gain, readout noise vs gain, excess noise and linearity. The EM gain calibration is important to keep all EMCCD channels in the linear regime and the camera manufacturer carries it out, but it is reported that the multiplication gain may suffer ageing and degradation even if the camera is not in use. This suggests the need to monitor this ageing. In this paper it is proposed and tested a procedure for predictive maintenance that re-characterize the system gain, electron- multiplication gain and linearity periodically in order to predict the eventual ageing of the EMCCD multiplying registers. This procedure can be carried out quickly while the detector is installed in the WFS and in operational status. In order to provide the required illumination, the GTCAO calibration system is used.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Óscar Tubío Araújo, Miguel Núñez Cagigal, Ruben Thor Wenzel Argüelles, Roberto López López, Roberto Luis Simoes, José Marco de la Rosa, Icíar Montilla, Jesús Patrón Recio, Marta Puga Antolín, Marcos Reyes García-Talavera, Luis Fernando Rodríguez Ramos, Josefina Rosich Minguell, Victor J. S. Béjar, and Alastair Basden "EMCCD in-situ periodic characterization in Shack-Hartmann wavefront sensor for GTCAO", Proc. SPIE 10703, Adaptive Optics Systems VI, 107034W (12 July 2018); https://doi.org/10.1117/12.2312641
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 11 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Electron multiplying charge coupled devices
Light emitting diodes
Wavefront sensors
Cameras
Charge-coupled devices
Sensors
Adaptive optics
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top