Retardance polarization measurement based on a dual rotating polarizer arrangement

David I. Serrano-García; Humberto Macías-Mendoza; Jorge L. Flores; Guillermo García-Torales; Gelizlte A. Parra-Escamilla; Antonio Muñoz

doi:10.1117/12.2321676

18 September 2018 Retardance polarization measurement based on a dual rotating polarizer arrangement

David I. Serrano-García, Humberto Macías-Mendoza, Jorge L. Flores, Guillermo García-Torales, Gelizlte A. Parra-Escamilla, Antonio Muñoz

Author Affiliations +

Proceedings Volume 10765, Infrared Remote Sensing and Instrumentation XXVI; 107650N (2018) https://doi.org/10.1117/12.2321676
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

We present a polarization sensitive measurement focused on retrieve elliptical phase retardation properties. The system is based on rotating two linear polarizers. And a demodulation algorithm is proposed to retrieve a partial matrix of Muller from the intensity output signal. The polarimetry setup also employs a monochrome camera as detection system and a HeNe laser as light source. Simulation and experimental results in transparent samples are presented showing the feasibility of the measurement and the potential usage in a multiwavelength arrangement.

Conference Presentation

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David I. Serrano-García, Humberto Macías-Mendoza, Jorge L. Flores, Guillermo García-Torales, Gelizlte A. Parra-Escamilla, and Antonio Muñoz "Retardance polarization measurement based on a dual rotating polarizer arrangement", Proc. SPIE 10765, Infrared Remote Sensing and Instrumentation XXVI, 107650N (18 September 2018); https://doi.org/10.1117/12.2321676

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