Paper
8 February 2019 Composition dependence of the ultraviolet absorption edge in lithium tantalate films
Binwei Sun, Jun Gou, Jun Wang, Yadong Jiang
Author Affiliations +
Proceedings Volume 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging; 108431P (2019) https://doi.org/10.1117/12.2509041
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China
Abstract
The structural and optical characteristics of nearly stoichiometric lithium tantalate films have been studied. The LiTaO3 films were prepared by RF magnetron sputtering method and the phase was confirmed by powder X-ray diffraction. The optical properties were obtained from optical transmittance spectroscopy in UV-vis.-NIR range. The electronic band gap structure were determined from the fundamental absorption edge in the UV region. The evolution of defect structures caused by varying composition and post-growth processing has been evaluated from the optical absorption measurements. Optical absorption studies showed that the UV absorption edge is very sensitive to the composition of LiTaO3 films. The absorption features in the UV range indicate the discrete nature of conduction band and the allowed energy levels in the forbidden gap appeared due to surface defects.
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Binwei Sun, Jun Gou, Jun Wang, and Yadong Jiang "Composition dependence of the ultraviolet absorption edge in lithium tantalate films", Proc. SPIE 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging, 108431P (8 February 2019); https://doi.org/10.1117/12.2509041
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KEYWORDS
Absorption

Annealing

Thin films

Crystals

Lithium

Ultraviolet radiation

Transparent conductors

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