Modified Z-scan technique using a segmented photodiode

Manuel Ferdinandus; Jamie Gengler; Michael Tripepi; Carl Liebig

doi:10.1117/12.2508806

4 March 2019 Modified Z-scan technique using a segmented photodiode

Manuel Ferdinandus, Jamie Gengler, Michael Tripepi, Carl Liebig

Proceedings Volume 10902, Nonlinear Frequency Generation and Conversion: Materials and Devices XVIII; 1090217 (2019) https://doi.org/10.1117/12.2508806
Event: SPIE LASE, 2019, San Francisco, California, United States

Abstract

We develop a modification of the Z-scan technique that simultaneously measures the nonlinear refraction and absorption while using a single detector. This modification utilizes a quadrant cell detector to measure both the change in absorption and spot size due to the optical nonlinearity without the use of a partially closed aperture or second detector. This improves the ease of alignment, requires half the detectors and utilizes all of the available beam power. This modification is especially useful at IR wavelengths, where alignment can be difficult and detector responsivities are low limiting available signal to noise.

Conference Presentation

Citation Download Citation

Manuel Ferdinandus, Jamie Gengler, Michael Tripepi, and Carl Liebig "Modified Z-scan technique using a segmented photodiode", Proc. SPIE 10902, Nonlinear Frequency Generation and Conversion: Materials and Devices XVIII, 1090217 (4 March 2019); https://doi.org/10.1117/12.2508806

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