Presentation + Paper
13 May 2019 Microscopic image enhancement based on Fourier ptychography technique
Author Affiliations +
Abstract
Image enhancement technique is utilized to emphasize the overall or local characteristics of pictures and widely used in aerospace, and machine vision application. However, most of these techniques are mathematical algorithms based on captured pictures instead of the imaging process. Fourier ptychographic microscopy (FPM) is a recently developed computational imaging approach which stitches together low-resolution images acquired under different angles of illumination with the same intensity in Fourier space to produce a wide-field, high-resolution complex sample image. In this article, a theoretical model about the illumination intensity is proposed. The effect of uneven illumination intensity can be reduced significantly based on our model. Furthermore, the quality of the reconstructed image can be enhanced by adjusting the intensity of the illumination light corresponding to the high frequency components of the original spectrum.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ying Wang, Guocheng Zhou, Yao Hu, Xuemin Cheng, Qun Hao, and Shaohui Zhang "Microscopic image enhancement based on Fourier ptychography technique", Proc. SPIE 10990, Computational Imaging IV, 109900B (13 May 2019); https://doi.org/10.1117/12.2519602
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Signal to noise ratio

Light emitting diodes

Image quality

Image processing

Interference (communication)

Digital imaging

Image enhancement

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