An over-top tracking test system for electro-optical detection device

Shaofei Wang; Fei Xie; Dezhao Zhou; Baolin Du

doi:10.1117/12.2520132

12 March 2019 An over-top tracking test system for electro-optical detection device

Shaofei Wang, Fei Xie, Dezhao Zhou, Baolin Du

Proceedings Volume 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application; 110230J (2019) https://doi.org/10.1117/12.2520132
Event: Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 2018, Xi'an, China

Abstract

In this paper, an over-top tracking test system for electro-optical detection device is designed, which provides an overtop test environment for electro-optical detection device by using a two-dimensional motion turntable covering the target source of the infrared and visible light bands in a rolling and pitching shafting system. The electro-optical detection device for two-frame configuration provides over-top tracking[1] function and performance testing and verification conditions.

Citation Download Citation

Shaofei Wang, Fei Xie, Dezhao Zhou, and Baolin Du "An over-top tracking test system for electro-optical detection device", Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110230J (12 March 2019); https://doi.org/10.1117/12.2520132

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