Paper
24 January 2019 1.3μm InAs/InGaAs QD laser steady output power over 1.07 W
Author Affiliations +
Proceedings Volume 11052, Third International Conference on Photonics and Optical Engineering; 1105212 (2019) https://doi.org/10.1117/12.2521947
Event: The International Conference on Photonics and Optical Engineering, 2018, Xi'an, China
Abstract
Here we report the solid source molecular beam epitaxy (MBE) growth of high quality of InGaAs/ GaAs quantum dot (QD) structures. A laser device is fabricated by the semiconductor process, including Lithography, Inductively Coupled Plasma (ICP), Plasma Enhanced Chemical Vapor Deposition (PECVD) and Reactive Ion Etching (RIE). The rigid is 100μm wide and cavity is 2000um long. Room temperature continuous-wave (CW) operation with emission wavelength around 1.31μm is presented. Threshold current (Ith) and threshold current density (Jth) is 0.3A and 150A/cm2 at 15°, and output power at Ith=7A reached as high as 1.079W. We also observe that the spectrum shift from 1315nm to 1333nm when the injection currents increase from 1.5A to 3.5A, and the shift speed is 8.72 nm/A.
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Fu-Hui Shao, Yi Zhang, Xiang-Bin Su, Hui-ming Hao, Ying-Qiang Xu, Hai-Qiao Ni, Yu Zhang, and Zhi-Chuan Niu "1.3μm InAs/InGaAs QD laser steady output power over 1.07 W", Proc. SPIE 11052, Third International Conference on Photonics and Optical Engineering, 1105212 (24 January 2019); https://doi.org/10.1117/12.2521947
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KEYWORDS
Gallium arsenide

Quantum dots

Laser marking

Plasma enhanced chemical vapor deposition

Reactive ion etching

Continuous wave operation

Gallium

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