Paper
25 September 1989 Off-Site Radiation Testing Of Cryo Focal Plane Components
James B. Parkinson
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Abstract
Experience shows that there is no only-way to accomplish radiation testing in the field. Many good tests have been done with sketchy plans and written procedures but by a test crew that has the knack to respond quickly to implications of each succeeding test result and to things that go wrong. Other good tests have been conducted with detailed written plans and procedures, though usually with some on-the-spot modifications. Failure most often results from either poor planning or rigid procedures, carelessness in preparation or test conduct, non-response to the unforeseen, and occasionally from facility failure.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James B. Parkinson "Off-Site Radiation Testing Of Cryo Focal Plane Components", Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); https://doi.org/10.1117/12.960696
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KEYWORDS
Infrared detectors

Sensors

Cryogenics

Photomultipliers

Analog electronics

Glasses

Solid state electronics

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