A futuristic thin-film transistor based on a double-well heterostructure exploiting the band-gap tailoring property of Zinc Oxide (ZnO) has been proposed. Effects of carrier confinement in the MgZnO/CdZnO heterojunction have been studied by employing an additional MgZnO barrier in the CdZnO channel to create two potential wells. Carrier transport and device operation have been explained with the help of energy band diagrams extracted at different operating voltages. The optimised double-well structure yields an unprecedented ION/IOFF=1015, simultaneously achieving a sub-threshold swing=74mV/decade, thereby indicating high switching speed. A high value of field-effect mobility, (μFE, max=32cm2 /V-s) over a wide range of gate bias, manifests its ability to overcome the carrier scattering problem due to confinement, making it a promising candidate for high resolution and fast response optical display applications.
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