X-ray reflectivity measurements at chromium-iridium tri-layer coatings

Veronika Stehlíkova; Thorsten Döhring; Tobias Schäfer; Manfred Stollenwerk; Peter Friedrich; Vadim Burwitz; Gisela Hartner; Miranda Bradshaw; Yingyu Liao; Carlo Pelliciari

doi:10.1117/12.2530439

9 September 2019 X-ray reflectivity measurements at chromium-iridium tri-layer coatings

Veronika Stehlíkova, Thorsten Döhring, Tobias Schäfer, Manfred Stollenwerk, Peter Friedrich, Vadim Burwitz, Gisela Hartner, Miranda Bradshaw, Yingyu Liao, Carlo Pelliciari

Author Affiliations +

Proceedings Volume 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX; 111191L (2019) https://doi.org/10.1117/12.2530439
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Studying astronomical objects in the X-ray regime, iridium-based layer systems are highly effective reflective materials for telescopes mirrors. Aschaffenburg University and the Czech Technical University in Prague jointly developed stress compensated chromium-iridium coatings. To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy and improve general reflectivity at lower incident energies, thin overcoat layers of chromium have been applied in addition. Corresponding measurements at several X-ray lines have been performed on these samples at the PANTER test facility of the Max-Planck Institute for extraterrestrial Physics. A part of the experimental results and their comparison with theoretical simulations are presented in this contribution.

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Veronika Stehlíkova, Thorsten Döhring, Tobias Schäfer, Manfred Stollenwerk, Peter Friedrich, Vadim Burwitz, Gisela Hartner, Miranda Bradshaw, Yingyu Liao, and Carlo Pelliciari "X-ray reflectivity measurements at chromium-iridium tri-layer coatings", Proc. SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 111191L (9 September 2019); https://doi.org/10.1117/12.2530439

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