Measurement Of The Effects Of Particulate Contamination On X-Ray Reflectivity

P. Slane; E. R. McLaughlin; D. A. Schwartz; L. P. Van Speybroeck; J. W. Bilbro; B. H. Nerren

doi:10.1117/12.955568

11 October 1989 Measurement Of The Effects Of Particulate Contamination On X-Ray Reflectivity

P. Slane, E. R. McLaughlin, D. A. Schwartz, L. P. Van Speybroeck, J. W. Bilbro, B. H. Nerren

Proceedings Volume 1113, Reflective Optics II; (1989) https://doi.org/10.1117/12.955568
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

Because particles of sizes larger than a few tenths microns adversely affect hight resolution X-ray telescopes by scattering and absorbing X-rays, we are investigating the clean-liness required to maintain the ~1% overall calibration precision desired for the Advanced X-ray Astrophysics Facility (AXAF). At the grazing angles used for the AXAF mirrors, each particle shadows a surface area ~ 10² times its geometric area, necessitating glass occlusion specifications much more stringent than typically stipulated for visible-light particulate contamination. On test fiats coated with gold, we have deposited controlled levels of contamination spanning the range from 5 x 10^-5 to 5 x 10^-3 fractional area covered and have measured the absorption component of extinction over a range of grazing angles and X-ray energies to verify the predicted effects of particulate contamination. Further tests are planned to examine a wider range of energies and to take into account sample flatness and distortions introduced by holding fixtures.

Citation Download Citation

P. Slane, E. R. McLaughlin, D. A. Schwartz, L. P. Van Speybroeck, J. W. Bilbro, and B. H. Nerren "Measurement Of The Effects Of Particulate Contamination On X-Ray Reflectivity", Proc. SPIE 1113, Reflective Optics II, (11 October 1989); https://doi.org/10.1117/12.955568

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