Paper
16 July 2019 Application of spectral statistics to surface defect detection
Author Affiliations +
Proceedings Volume 11172, Fourteenth International Conference on Quality Control by Artificial Vision; 1117211 (2019) https://doi.org/10.1117/12.2521714
Event: Fourteenth International Conference on Quality Control by Artificial Vision, 2019, Mulhouse, France
Abstract
The development of a spectral difference-based statistical processing of hyperspectral images is provided in this article. Kullback-Leibler pseudo-divergence function, which was specifically developed for the metrological processing of hyperspectral images, is used at the foundation of the statistics. As a demonstration of its use, the proposed statistics are used in visualising surface variability within a set of pigment patches. It is then further exploited to detect anomalies and deterioration that occur on the patches.
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Hilda Deborah, Noël Richard, and Jon Yngve Hardeberg "Application of spectral statistics to surface defect detection", Proc. SPIE 11172, Fourteenth International Conference on Quality Control by Artificial Vision, 1117211 (16 July 2019); https://doi.org/10.1117/12.2521714
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KEYWORDS
Metrology

Statistical analysis

Hyperspectral imaging

Visualization

Defect detection

Printing

Mahalanobis distance

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