Improved x-ray fluorescent wavelength dispersive spectrometer

Mykola H. Tarnovskyi; Gennadii D. Doroshchenkov; Grigorii P. Pustovit; Krzysztof Skorupski

doi:10.1117/12.2536609

6 November 2019 Improved x-ray fluorescent wavelength dispersive spectrometer

Mykola H. Tarnovskyi, Gennadii D. Doroshchenkov, Grigorii P. Pustovit, Krzysztof Skorupski

Proceedings Volume 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019; 111760A (2019) https://doi.org/10.1117/12.2536609
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 2019, Wilga, Poland

Abstract

The principles of construction of various types of spectrometers used for x-ray fluorescence are considered, their advantages and disadvantages are analyzed. An approach to the implementation of the wavelength dispersive spectrometer is proposed, which allows to reduce the time of spectral analysis in the entire range of the x-ray fluorescence.

Citation Download Citation

Mykola H. Tarnovskyi, Gennadii D. Doroshchenkov, Grigorii P. Pustovit, and Krzysztof Skorupski "Improved x-ray fluorescent wavelength dispersive spectrometer", Proc. SPIE 11176, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019, 111760A (6 November 2019); https://doi.org/10.1117/12.2536609

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