High-order PT symmetry-based optical sensor

Yulin Wu; Peiji Zhou; Ting Li; Weishi Wan; Yi Zou

doi:10.1117/12.2546440

25 February 2020 High-order PT symmetry-based optical sensor

Yulin Wu, Peiji Zhou, Ting Li, Weishi Wan, Yi Zou

Proceedings Volume 11283, Integrated Optics: Devices, Materials, and Technologies XXIV; 112830L (2020) https://doi.org/10.1117/12.2546440
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

We investigate a fourth-order PT symmetric optical sensor and analyze its eigenfrequency phase diagram. The four eigenfrequencies of our optical sensor simultaneously collapse at the high-order exceptional point in parameter space, providing a quarter root relation between the frequency splitting amount and the perturbation. A clear sensitivity boost is observed when comparing the frequency splitting with other optical sensors under small perturbation condition.

Citation Download Citation

Yulin Wu, Peiji Zhou, Ting Li, Weishi Wan, and Yi Zou "High-order PT symmetry-based optical sensor", Proc. SPIE 11283, Integrated Optics: Devices, Materials, and Technologies XXIV, 112830L (25 February 2020); https://doi.org/10.1117/12.2546440

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