Presentation
24 March 2020 EUV sensitization mechanisms of carboxylic acids used as ligands of metal oxide nanocluster resists (Conference Presentation)
Takahiro Kozawa, Yusa Muroya
Author Affiliations +
Abstract
Recently, the metal oxide nanoclusters (or nanoparticles) have attracted much attention as a promising candidate for a resist material used for the high-volume manufacturing of semiconductor devices. The radiation-induced reactions of ligands play an important role in the sensitization of metal oxide nanocluster resists. In this study, the radiation-induced reactions of carboxylic acid ligands were investigated using a pulse radiolysis method. The results obtained in this study indicated that the molecular structures of ligands affect their reactivity to cationic and anion species and the stability of their radical cations and anions.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takahiro Kozawa and Yusa Muroya "EUV sensitization mechanisms of carboxylic acids used as ligands of metal oxide nanocluster resists (Conference Presentation)", Proc. SPIE 11323, Extreme Ultraviolet (EUV) Lithography XI, 113231B (24 March 2020); https://doi.org/10.1117/12.2554989
Advertisement
Advertisement
Back to Top