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21 April 2020 Uniaxial fringe projection profilometry using projection defocus
Yi Zheng, Yajun Wang, Beiwen Li
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Proceedings Volume 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX; 1139708 (2020) https://doi.org/10.1117/12.2558996
Event: SPIE Defense + Commercial Sensing, 2020, Online Only
Abstract
This paper introduces a novel uniaxial fringe projection profilometry (FPP) called active shape from projection defocus profilometry (ASPDP), which utilizes the sharpness analysis of binary fringe patterns to quantify the defocus level. Compared with previous uniaxial FPP methods, our work first utilizes a pinhole defocus model to account for three-dimensional reconstruction. Since defocused fringe pattern can be modeled as the original pattern convoluted with a point spread function (PSF), pixel-wise defocus level can be quantified with this PSFs kernel using temporal Fourier analysis. In this research, calibration is achieved by using a mechanical translation device, and determined by rational polynomial fitting to establish defocus-depth relationship. The experiment demonstrates that this method can provide an accurate reconstructed 3D geometry without shadows.
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Yi Zheng, Yajun Wang, and Beiwen Li "Uniaxial fringe projection profilometry using projection defocus", Proc. SPIE 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX, 1139708 (21 April 2020); https://doi.org/10.1117/12.2558996
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KEYWORDS
Fringe analysis
Calibration
3D metrology
Point spread functions
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