Developing high-performance thin film transistors (TFTs) based on hybrid organic-inorganic perovskites has to date been surprisingly problematic. This is in-part attributed to ionic screening of the transistor channel under applied gate voltages, and subsequent difficulty in accumulating electronic charge. Not only does this make progress in TFT technology challenging, but it also excludes TFTs as effective probes of mobility, something for which TFTs are routinely employed by the organic semiconductor community. In this talk I discuss the use of contactless time-resolved microwave conductivity (TRMC) methods in evaluating mobility in semiconductors. I demonstrate how TRMC can be used to evaluate carrier mobility in powders of new semiconductors, eliminating the major bottleneck of device optimization. We can also resolve the mobility in-plane and out-of-plane of thin-films, as well as photo-induced changes in the relative permittivity of semiconductors.
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