Wave optics simulations for new soft x-ray beamlines at NSLS-II

A. He; O. Chubar; J. Dvorak; W. Hu; S. Hulbert; A. Walter; S. Wilkins; C. Salort

doi:10.1117/12.2567423

21 August 2020 Wave optics simulations for new soft x-ray beamlines at NSLS-II

A. He, O. Chubar, J. Dvorak, W. Hu, S. Hulbert, A. Walter, S. Wilkins, C. Salort

Proceedings Volume 11493, Advances in Computational Methods for X-Ray Optics V; 1149307 (2020) https://doi.org/10.1117/12.2567423
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

We performed fully- and partially-coherent synchrotron emission and propagation simulations with the "Synchrotron Radiation Workshop" computer code to analyze the performance of two soft X-ray beamlines under development at the National Synchrotron Light Source II: Soft X-ray Nanoprobe (SXN), and Angle-Resolved Photoemission Spectroscopy (ARPES) and Resonant Inelastic X-ray Scattering (RIXS) Imaging (ARI). The SXN beamline intends to provide high flux and high spatial resolution coherent soft X-ray imaging capabilities using both zone plate and lensless coherent imaging techniques. The ARI beamline aims to perform high flux ARPES and RIXS experiments with a focal spot size at the sample approaching 100 nm using highly-demagnifying mirrors in Kirkpatrick-Baez geometry. To accurately calculate the resolution and the degree of X-ray coherence provided by the two state-of-the-art beamlines, partial coherence effects are required to be taken into account in wave optics simulations for these two beamlines. In this talk, beamline performance parameters such as spot size, degree of coherence, flux, and energy resolution at the sample are presented. The effects of mirror surface slope errors on beamline performance were studied and some suggestions for further optimization are discussed.

Conference Presentation

Citation Download Citation

A. He, O. Chubar, J. Dvorak, W. Hu, S. Hulbert, A. Walter, S. Wilkins, and C. Salort "Wave optics simulations for new soft x-ray beamlines at NSLS-II", Proc. SPIE 11493, Advances in Computational Methods for X-Ray Optics V, 1149307 (21 August 2020); https://doi.org/10.1117/12.2567423

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