Specification on x-ray mirror quality considering the partial coherence in advanced light source

Fugui Yang; Ming Li; Quanjie Jia; Weiwei Zhang; Xiaowei Zhang; Weifan Sheng

doi:10.1117/12.2567485

21 August 2020 Specification on x-ray mirror quality considering the partial coherence in advanced light source

Fugui Yang, Ming Li, Quanjie Jia, Weiwei Zhang, Xiaowei Zhang, Weifan Sheng

Proceedings Volume 11493, Advances in Computational Methods for X-Ray Optics V; 114930O (2020) https://doi.org/10.1117/12.2567485
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

For the advanced light source including Free Electron Laser (FEL) and Synchrotron Radiation Facility, X-ray mirrors are very important component for X-ray transport in beamlines. The surface quality requirement on the mirrors for the Free Electron Laser (FEL) or for diffraction-limit application has been studied by many researchers. In this paper, the mirror quality specification in non-diffraction limited case is studied for the partial coherence light source. Simplified model for the beamline system is given and compared with other numerical simulation software. Then, the surface quality on the system performance is studied with special concern on focusing beam without structured or non-uniform pattern. Considering the characteristics of the real mirror error, the general requirement on the mirror surface quality is given for HEPS beamline design.

Conference Presentation

Citation Download Citation

Fugui Yang, Ming Li, Quanjie Jia, Weiwei Zhang, Xiaowei Zhang, and Weifan Sheng "Specification on x-ray mirror quality considering the partial coherence in advanced light source", Proc. SPIE 11493, Advances in Computational Methods for X-Ray Optics V, 114930O (21 August 2020); https://doi.org/10.1117/12.2567485

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