Poster + Presentation
22 February 2021 Experimental validation of particle impact on thermo-mechanical behavior of EUV pellicle
Author Affiliations +
Conference Poster
Abstract
Possibility of localized thermal gradient near particles on pellicle surface during EUV-induced heat load was investigated. Optical/thermo-mechanical simulations were performed to calculate EUV/UV absorbance and thermal stress distribution of a particle contaminated pellicle. Ru/SiNx double-stack pellicles were fabricated and contaminated by particles of Ti, C, Fe which are the main contamination species in a EUV scanner. As a result, a localized thermal stress was induced by particles and a shorter lifetime was observed for a membrane contaminated with larger particles.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yong Ju Jang, Seong Ju Wi, Chang Soo Kim, Ha Neul Kim, and Jinho Ahn "Experimental validation of particle impact on thermo-mechanical behavior of EUV pellicle", Proc. SPIE 11609, Extreme Ultraviolet (EUV) Lithography XII, 116091X (22 February 2021); https://doi.org/10.1117/12.2587398
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