Backscatter Signature Generator For OTDR Calibration

Chun Keung Hui; Neil Kamikawa; Ken Yamada

doi:10.1117/12.963454

23 January 1990 Backscatter Signature Generator For OTDR Calibration

Chun Keung Hui, Neil Kamikawa, Ken Yamada

Proceedings Volume 1180, Tests, Measurements, and Characterization of Electro-Optic Devices and Systems; (1990) https://doi.org/10.1117/12.963454
Event: OE/FIBERS '89, 1989, Boston, United States

Abstract

This paper describes an active characterization technique that generates backscatter signatures to measure the performance of optical time-domain reflectometers (OTDRs). These signatures can be used to test an OTDR's loss accuracy, dynamic range, spatial resolution, loss resolution, and receiver recovery time.

Citation Download Citation

Chun Keung Hui, Neil Kamikawa, and Ken Yamada "Backscatter Signature Generator For OTDR Calibration", Proc. SPIE 1180, Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (23 January 1990); https://doi.org/10.1117/12.963454

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