MWIR scatter of antireflective nanostructured windows

David A. Gonzalez; Karun Vijayraghavan; Menelaos K. Poutous

doi:10.1117/12.2601567

4 March 2022 MWIR scatter of antireflective nanostructured windows

David A. Gonzalez, Karun Vijayraghavan, Menelaos K. Poutous

Proceedings Volume 11997, Optical Components and Materials XIX; 1199702 (2022) https://doi.org/10.1117/12.2601567
Event: SPIE OPTO, 2022, San Francisco, California, United States

Abstract

Subwavelength randomly nano-roughened interfaces have been shown to have polarization-insensitive, angle-ofincidence independent, broadband anti-reflective (AR) performance. The on-axis AR effect correlates with the nanoroughness longitudinal scale (depth), whereas feature transverse dimension distributions (average feature diameters) are responsible for diffracting (scattering) light. In cases where the surface RMS roughness parameter value approaches the incident radiation wavelength, diffuse scatter increases above axial transmission values. Random anti-reflective structured surface (rARSS) windows were fabricated to suppress axial reflectivity over the MWIR spectral band (3-5 μm) and transmission enhancement was confirmed via FTIR spectrophotometry. Using a polarized-laser scatterometer, bidirectional scattering distribution function (BSDF) of structured IR materials was measured using 3.39-μm-wavelength source at selected incidence angles over the equatorial plane of the unit sphere. Surface statistics of the roughened samples is correlated to the radiance distribution for assessment of surface-feature scattering effects.

Conference Presentation

Citation Download Citation

David A. Gonzalez, Karun Vijayraghavan, and Menelaos K. Poutous "MWIR scatter of antireflective nanostructured windows", Proc. SPIE 11997, Optical Components and Materials XIX, 1199702 (4 March 2022); https://doi.org/10.1117/12.2601567

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