Low loss ultra-smooth gold films for two-dimensional material plasmonic devices

Jie Luo; Chunchao Wen; Zhihong Zhu; Jianfa Zhang

doi:10.1117/12.2617527

9 December 2021 Low loss ultra-smooth gold films for two-dimensional material plasmonic devices

Jie Luo, Chunchao Wen, Zhihong Zhu, Jianfa Zhang

Proceedings Volume 12030, Third International Conference on Optoelectronic Science and Materials (ICOSM 2021); 1203003 (2021) https://doi.org/10.1117/12.2617527
Event: Third International Conference on Optoelectronic Science and Materials (ICOSM 2021), 2021, Hefei, China

Abstract

The search for low loss plasmonic metals have been a long-standing research topic in the nanophotonics community. This issue becomes even more important for two-dimensional plasmonic devices as the light-matter interaction with twodimensional materials will be significantly suppresses by metal absorption due to their atomic thickness. In this paper, we have numerically demonstrated that light amplification may be achieved in a plasmonic resonant metasurface using a lower loss metal film. Using a modified template peeling method, we found that the gold films obtained by template peeling have a better three-dimensional morphology than those obtained by vapour deposition, while the gold films obtained by template peeling have a lower relative dielectric constant imaginary part in the 400-800 nm band as measured by ellipsometric polarisation. We expect that further improvement of the fabrication method for the low loss ultra-smooth plasmonic films will lead to the demonstration of high performance two-dimensional materials plamsonic devices such as lasers or spasers.

Citation Download Citation

Jie Luo, Chunchao Wen, Zhihong Zhu, and Jianfa Zhang "Low loss ultra-smooth gold films for two-dimensional material plasmonic devices", Proc. SPIE 12030, Third International Conference on Optoelectronic Science and Materials (ICOSM 2021), 1203003 (9 December 2021); https://doi.org/10.1117/12.2617527

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KEYWORDS

Metals

Gold

Plasmonics

Absorption

Refractive index

Surface roughness

Thin films

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