Laboratory x-ray spectrometer for XAFS measurements

Weiquan Zhang; Jin Shen; Zhanglang Xu; Minghao Lin; Xuewei Du; Qiuping Wang

doi:10.1117/12.2606971

24 November 2021 Laboratory x-ray spectrometer for XAFS measurements

Weiquan Zhang, Jin Shen, Zhanglang Xu, Minghao Lin, Xuewei Du, Qiuping Wang

Proceedings Volume 12064, AOPC 2021: Optical Spectroscopy and Imaging; 120640P (2021) https://doi.org/10.1117/12.2606971
Event: Applied Optics and Photonics China 2021, 2021, Beijing, China

Abstract

X-ray absorption fine structure (XAFS) is an important tool for materials information of atoms with bond length, coordination numbers and electronic state. Most of the related research has been performed at the synchrotron radiation facility for past decades. The development of conventional X-ray source and bent crystal analyzer makes it possible to conduct XAFS experiment in the laboratory. We developed a laboratory X-ray absorption spectrometer. It includes an conventional X-ray source, a Johann-type spherically bent crystal analyzer, precision Rowland circle scanning mechanism, and a silicon drift detector. The spectrometer is designed for both the X-ray absorption near-edge structure (XANES) and the extended X-ray absorption fine structure (EXAFS) analysis. The spectrometer covers the photon energy range of 8.9 – 9.6 keV and the energy resolution is about 1.2 – 3.5 eV with W anode source (spot size 0.4 mm) and Ge(800) crystal. The absorption spectrum of a copper foil with thickness of 10 μm is measured. The result is similar to that conducted at the synchrotron radiation facility.

Citation Download Citation

Weiquan Zhang, Jin Shen, Zhanglang Xu, Minghao Lin, Xuewei Du, and Qiuping Wang "Laboratory x-ray spectrometer for XAFS measurements", Proc. SPIE 12064, AOPC 2021: Optical Spectroscopy and Imaging, 120640P (24 November 2021); https://doi.org/10.1117/12.2606971

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KEYWORDS

Spectroscopy

Crystals

X-rays

Absorption

X-ray sources

Copper

Sensors

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