Presentation + Paper
30 May 2022 THz response based hardware security and reliability testing powered by deep learning image classification
Author Affiliations +
Abstract
THz testing has been recently proposed to identify altered or damaged ICs. This method is based on the fact that a modern field-effect transistor (FET) with a sufficiently short channel can serve as a terahertz detector. The response can be recorded while changing the THz radiation parameters and location and compared to a trusted one for classification. We measured the THz response of original and damaged ICs for classification using different Transfer Learning models as a method of deep learning. We have achieved the highest classification accuracy of 98%.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Naznin Akter, Masudur R. Siddiquee, John Suarez, Michael Shur, and Nezih Pala "THz response based hardware security and reliability testing powered by deep learning image classification", Proc. SPIE 12091, Image Sensing Technologies: Materials, Devices, Systems, and Applications IX, 120910C (30 May 2022); https://doi.org/10.1117/12.2626871
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Data modeling

Terahertz radiation

Convolution

Image classification

Performance modeling

Neural networks

Integrated circuits

RELATED CONTENT


Back to Top