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15 February 2022 Parameter sensitivity of temperature response characteristics in the thermistor pasting technology
Xusheng Zhang, Liangdan Cao, Liang Guo, Chunlong Liu, Yong Huang
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Proceedings Volume 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021); 1216615 (2022) https://doi.org/10.1117/12.2609149
Event: Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 2021, Hong Kong, Hong Kong
Abstract
In this paper, the effects of uncertain factors in the thermistor pasting technology are researched using parameter sensitivity analysis method. The relevance between thickness of electrical insulating tape, contact interface area, thermal contact conductance and thermal time constant is analyzed, and sensitivity classification of uncertain factors is done by the absolute/relative variation of thermal time constant. Research shows that 1) thickness of electrical insulating tape dPI and thermal contact conductance ht are the insensitive parameters about thermal time constant in the surface pasting technology, relative sensitivity indexes are 0.169[s0.5/μm0.5] and 0.292[m·s0.5·K0.5/W0.5] respectively; 2) contact interface area At is the sensitive parameter about thermal time constant in the surface pasting technology, absolute variation and relative sensitivity index is 124.6s and 3.530[s0.5/mm] separately; 3) in addition to the high-precision calibration, filtering the sensitive-bead size and contact interface area strictly are also critical for improving the real-time measurement accuracy and temperature-changing response speed of thermistors.
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Xusheng Zhang, Liangdan Cao, Liang Guo, Chunlong Liu, and Yong Huang "Parameter sensitivity of temperature response characteristics in the thermistor pasting technology", Proc. SPIE 12166, Seventh Asia Pacific Conference on Optics Manufacture and 2021 International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2021), 1216615 (15 February 2022); https://doi.org/10.1117/12.2609149
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KEYWORDS
Interfaces
Temperature metrology
Analytical research
Resistance
Temperature sensors
Thermal analysis
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