Paper
27 March 2022 Fixed pattern noise of microchannel plate
Author Affiliations +
Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 12169BC (2022) https://doi.org/10.1117/12.2626815
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China
Abstract
Fixed pattern noise (FPN) is a kind of image defect of microchannel plate (MCP), which is manifested by uneven brightness between the boundary and inside of multi-fibers. The formation mechanism of FPN was revealed by analyzing the characteristics of FPN of the MCP. The results showed that FPN appears at the boundary of multi-fibers and three sets of opposite sides of the multi-fibers show different brightness. The cause for the formation of FPN is that the gain of the outermost mono-fibers of multi-fibers is inconsistent with that of the inner of multi-fibers. The uneven brightness in the three sets of opposite sides is because of the different morphology of them. In the drawing multi-fibers process, the outermost mono-fibers deform into an ellipse-like shape due to lack of restraint. After the MCP is sliced along a certain bias angel, the ellipticity changes. The ellipticity of one set of opposite sides increases, while that of the other two groups decrease. In the melting process, the multi-fibers rotate at a small angle, resulting in slight differences in ellipticity between the two groups. When the input electrons hit the wall in channels with different ellipticities, they will excite secondary electrons with different trajectories, thus showing FPN. In order to reduce FPN, the deformation of the outermost of monofibers should be reduced as much as possible in the drawing multi-fibers process. The study will provide fundamental insights and useful guidelines for improving the performance of MCP.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiao Lian, Tiezhu Bo, Chen Wang, Hua Cai, Xiaoxuan Shi, Chang Liu, Jing Ma, Shuaiqi Li, and Hui Liu "Fixed pattern noise of microchannel plate", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 12169BC (27 March 2022); https://doi.org/10.1117/12.2626815
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KEYWORDS
Microchannel plates

Electrons

Glasses

Cladding

Oscilloscopes

Particles

Polishing

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