Poster + Paper
29 August 2022 X-ray speed reading with the MCRC: a low noise CCD readout ASIC enabling readout speeds of 5 Mpixel/s/channel
Peter Orel, Sven Herrmann, Tanmoy Chattopadhyay, Glenn R. Morris, Steven W. Allen, Gregory Y. Prigozhin, Richard Foster, Andrew Malonis, Marshall W. Bautz, Michael J. Cooper, Kevan Donlon
Author Affiliations +
Conference Poster
Abstract
The X-ray Astronomy and Observational Cosmology (XOC) group at Stanford University, in collaboration with the Massachusetts Institute of Technology (MIT) and MIT Lincoln Laboratory (MIT-LL), is developing next generation X-ray detector and readout technologies. Specifically, the XOC group is developing a fast, low noise readout application specific integrated circuit (ASIC) that is intended to be paired with X-ray charge-coupled device (CCD) detectors in development at MIT-LL. This readout ASIC is denoted as the MIT CCD Readout Chip or MCRC. The MCRC prototype is designed in a 350 nm technology node featuring 8 channels. Each channel is composed of two inputs. One is dedicated to read out the proven source follower-based (SF) CCD architecture with two selectable gain settings, an input referred noise of 1.63 eRMS, an input dynamic range of ±160 mV, channel to channel crosstalk less than -75 dBc, a power consumption of roughly 30 mW/channel, and a bandwidth of approximately 50 MHz, translating to an effective rise time of around 5 ns. Such a response can comfortably support readout speeds for large CCD pixel matrices in excess of 5 Mpixel/s/channel. The chip also features a second input which is an experimental drain-current readout (DR) topology to support Single electron Sensitive Read Out (SiSeRO) CCD stages currently in development at MIT-LL. The MCRC excels in speed while its input noise and bandwidth are on par with commercial discrete offerings, but with smaller power and real-estate footprints. Here we present the latest measurement results for this state-of-the-art prototype readout ASIC.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Orel, Sven Herrmann, Tanmoy Chattopadhyay, Glenn R. Morris, Steven W. Allen, Gregory Y. Prigozhin, Richard Foster, Andrew Malonis, Marshall W. Bautz, Michael J. Cooper, and Kevan Donlon "X-ray speed reading with the MCRC: a low noise CCD readout ASIC enabling readout speeds of 5 Mpixel/s/channel", Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 1219124 (29 August 2022); https://doi.org/10.1117/12.2629049
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KEYWORDS
Charge-coupled devices

Analog electronics

X-rays

Sensors

Prototyping

Amplifiers

Digital electronics

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