Low-noise and conductively cooled microchannel plates

W. Bruce Feller

doi:10.1117/12.19475

1 July 1990 Low-noise and conductively cooled microchannel plates

W. Bruce Feller

Proceedings Volume 1243, Electron Image Tubes and Image Intensifiers; (1990) https://doi.org/10.1117/12.19475
Event: Electronic Imaging: Advanced Devices and Systems, 1990, Santa Clara, CA, United States

Abstract

Microchannel plate (MCP) dynamic range has recently been enhanced for both very low and very high input flux conditions. Improvements in MCP manufacturing technology reported earlier have led to MCPs with substantially reduced radioisotope levels, giving dramatically lower internal background-counting rates. An update is given on the Galileo low noise MCP. Also, new results in increasing the MCP linear counting range for high input flux densities are presented. By bonding the active face of a very low resistance MCP (less than 1 megaohm) to a substrate providing a conductive path for heat transport, the bias current limit (hence, MCP output count rate limit) can be increased up to two orders of magnitude. Normal pulse-counting MCP operation was observed at bias currents of several mA when a curved-channel MCP (80:1) was bonded to a ceramic multianode substrate; the MCP temperature rise above ambient was less than 40 C.

Citation Download Citation

W. Bruce Feller "Low-noise and conductively cooled microchannel plates", Proc. SPIE 1243, Electron Image Tubes and Image Intensifiers, (1 July 1990); https://doi.org/10.1117/12.19475

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