Presentation
13 July 2023 AI in automated scratch-dig inspection (Conference Presentation)
Author Affiliations +
Abstract
The tricky part in deploying AI models to production is often training, with two important prerequisites: One, training data must be representative of the data that the algorithm will see in later use. And two, training data must be properly labeled manually. In algorithms for automated optical inspection, there is a further problem: What if there are only a few examples of specific defect types? We tackled these problems with different strategies when developing our ARGOS system for scratch-dig inspection. We will present real-world examples of how AI algorithms can be used for defect detection and classification without large training databases.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel Kiefhaber, Peter Würtz, Maximilian Bopp, Wolfgang Mischler, and Jean-Michel Asfour "AI in automated scratch-dig inspection (Conference Presentation)", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252403 (13 July 2023); https://doi.org/10.1117/12.2663764
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KEYWORDS
Artificial intelligence

Inspection

Evolutionary algorithms

Data processing

Defect detection

Standards development

Neural networks

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