Depth-of-field extension in structured-light 3D surface imaging by fast chromatic focus stacking

Stefan Heist; Roland Ramm; Mohsen Mozaffari-Afshar; Daniel Höhne; Thomas Hilbert; Henri Speck; Siemen Kühl; Daniela Hoffmann; Sebastian Erbes; Peter Kühmstedt; Gunther Notni

doi:10.1117/12.2661183

15 June 2023 Depth-of-field extension in structured-light 3D surface imaging by fast chromatic focus stacking

Stefan Heist, Roland Ramm, Mohsen Mozaffari-Afshar, Daniel Höhne, Thomas Hilbert, Henri Speck, Siemen Kühl, Daniela Hoffmann, Sebastian Erbes, Peter Kühmstedt, Gunther Notni

Author Affiliations +

Proceedings Volume 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII ; 1252406 (2023) https://doi.org/10.1117/12.2661183
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States

Abstract

The depth range that can be captured by structured-light 3D sensors is limited by the depth of field of the lenses which are used. Focus stacking is a common approach to extend the depth of field. However, focus variation drastically reduces the measurement speed of pattern projection-based sensors, hindering their use in high-speed applications such as in-line process control. Moreover, the lenses’ complexity is increased by electromechanical components, e.g., when applying electronically tunable lenses. In this contribution, we introduce chromatic focus stacking, an approach that allows for a very fast focus change by designing the axial chromatic aberration of an objective lens in a manner that the depth-of-field regions of selected wavelengths adjoin each other. In order to experimentally evaluate our concept, we determine the distance-dependent 3D modulation transfer function at a tilted edge and present the 3D measurement of a printed circuit board with comparatively high structures.

Conference Presentation

Citation Download Citation

Stefan Heist, Roland Ramm, Mohsen Mozaffari-Afshar, Daniel Höhne, Thomas Hilbert, Henri Speck, Siemen Kühl, Daniela Hoffmann, Sebastian Erbes, Peter Kühmstedt, and Gunther Notni "Depth-of-field extension in structured-light 3D surface imaging by fast chromatic focus stacking", Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252406 (15 June 2023); https://doi.org/10.1117/12.2661183

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available