Two-dimensional LIV, spectrum, and beam characterization of individual emitters in a VCSEL array

Amir Sharghi; Frank Münchow; Arun Boddu; Thomas Limmer

doi:10.1117/12.2679760

7 August 2023 Two-dimensional LIV, spectrum, and beam characterization of individual emitters in a VCSEL array

Amir Sharghi, Frank Münchow, Arun Boddu, Thomas Limmer

Proceedings Volume 12624, Digital Optical Technologies 2023; 1262414 (2023) https://doi.org/10.1117/12.2679760
Event: SPIE Digital Optical Technologies, 2023, Munich, Germany

Abstract

LIV curves are fundamental measurement of laser diodes to determine electrical and optical operating characteristics. LIV curves consist of L-I curves (optical intensity against current) and V-I curves (voltage against current). LIV curves determine power conversion efficiency, threshold current, slope efficiency, kinks, rollover point and more. They are widely used at various stages since it is critical to identify failed DUTs early in the manufacturing process. LIV curves are always measured for the DUTs with single emitter or for DUT as a whole when consisting of many emitters. Detailed and comprehensive LIV test, spectrum and beam analysis of each single emitter of an array is the focus of this study. We extend existing one-dimensional LIV test, spectral and beam analysis (including beam numerical aperture, M2 and beam waist) to each single emitter of the laser diode array at well-controlled conditions. Our experimental design consists of camera based radiant power and spectrum measurement. This approach allows parallelization of the measurements, which reduces overall measurement time, and investigation on the cross-talk between individual emitters. We analyzed electrical, optical and spectral differences within emitters of a VCSEL array and as well with the array as a whole. The accepted range of variation can be set in order to identify underperforming or out-of-specification single emitters. Therefore, defect or deficient laser diodes are detected at early stages of the manufacturing process, saving time and money. Such comprehensive characterization of individual emitters is crucial for demanding applications such as facial recognition, 3D sensing, in cabin sensing, LiDAR and ranging.

Citation Download Citation

Amir Sharghi, Frank Münchow, Arun Boddu, and Thomas Limmer "Two-dimensional LIV, spectrum, and beam characterization of individual emitters in a VCSEL array", Proc. SPIE 12624, Digital Optical Technologies 2023, 1262414 (7 August 2023); https://doi.org/10.1117/12.2679760

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
13 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Vertical cavity surface emitting lasers

Semiconductor lasers

Near field optics

Optics manufacturing

Manufacturing

LIDAR

Near field

Show All Keywords

Keywords/Phrases

Search In:

Publication Years