Presentation + Paper
4 October 2023 Why you should pay attention to international standards in optical metrology
Author Affiliations +
Abstract
Optical metrology is a driving force in advancing industries ranging from consumer electronics to components for energy and transportation. Despite this progress, there is considerable wasted effort attributable to misleading instrument specifications, inconsistent calibrations, and ambiguous data processing procedures. Confusing statements of accuracy and uncertainty, inconsistencies in filtering and parameter calculations, and misunderstandings about measurement principles and limitations undermine confidence in measurement results. A greater awareness and use of international standards documents can improve the situation, leading to a wider adoption of optical methods. At the same time, there is a critical need for stronger engagement in the development of new standards by experts in optics and photonics.
Conference Presentation
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Peter de Groot, Han Haitjema, and Mark Malburg "Why you should pay attention to international standards in optical metrology", Proc. SPIE 12672, Applied Optical Metrology V, 1267203 (4 October 2023); https://doi.org/10.1117/12.2675503
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KEYWORDS
Standards development

Equipment

Calibration

Tunable filters

Metrology

Optical metrology

Optical surfaces

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