XPOL-III is a recently developed 180 nm CMOS VLSI ASIC integrating more than 100K pixels at 50um pitch in a total active area of 15 X 15 mm2 . Each channel directly samples the charge collected at its own anode and holds it for readout through the built-in, low noise spectroscopic electronics chain. A global control circuit allows for the reconstruction of the spatial distribution of the event charge and the suppression from the readout stream of those pixels below a programmable signal threshold. XPOL-III inherits from previous generations of this ASIC, and extends its predecessor’s performances in terms of readout speed and response uniformity, making XPOL-III a suitable option for high resolution, low noise, high data throughput X-ray detectors. Implementing a single photon detection architecture, XPOL-III provides accurate timing, energy and position resolved measurements when coupled to a proper photon to charge converter. We spot the principles of operation of XPOL-III and summarize the preliminary test results when integrated in its original context, the Gas Pixel Detector (GPD), the same detector class currently at the focus of the Imaging X-ray Polarimetry Explorer (IXPE) telescopes.
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