Paper
1 August 1990 Investigation of scattering caused by thin film columnar structure
Aleksei A. Bikov, V. V. Popov, Alexander V. Tikhonravov
Author Affiliations +
Proceedings Volume 1270, Optical Thin Films and Applications; (1990) https://doi.org/10.1117/12.20390
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
The most specific feature of thin i1m deposited in vacuum is there columnar structureI2. The investigation or its impact on the process of penetrating of electromagnetic waves turns to be the main goal of the present paper.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aleksei A. Bikov, V. V. Popov, and Alexander V. Tikhonravov "Investigation of scattering caused by thin film columnar structure", Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); https://doi.org/10.1117/12.20390
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KEYWORDS
Thin films

Scattering

Refractive index

Electromagnetic scattering

Numerical analysis

Electromagnetic radiation

Thin film coatings

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