Can surface plasmon resonance imaging accurately measure topographic height?

Hyeon-Bong Pyo; Jeong Won Park; Hyung Ju Park

doi:10.1117/12.3016200

13 March 2024 Can surface plasmon resonance imaging accurately measure topographic height?

Hyeon-Bong Pyo, Jeong Won Park, Hyung Ju Park

Proceedings Volume 12860, Plasmonics in Biology and Medicine XXI; 128600A (2024) https://doi.org/10.1117/12.3016200
Event: SPIE BiOS, 2024, San Francisco, California, United States

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Abstract

The study used a photon scanning tunneling microscope (PSTM) to obtain topographic and near-field images of dielectric surface features. Silica nanoprobes with an apex less than λ/10 were utilized. Light was directed through a prism to the metal-dielectric interface in total internal reflection (TIR) mode, with an adjustable incident angle and controlled polarization. Resonantly absorbed optical images of surface features were observed in the near-field, as well as interference patterns of surface plasmon waves at the plasmon resonance angle. Above the plasmon resonance, the optical images of surface features became inverted, indicating an off-resonance condition of the surface plasmons on the metal surface. The study found that the relative percent reflectivity (%ΔR) in the surface plasmon resonance imaging does not directly reflect the height of dielectric surface features, which mimic bio-materials on a sensor’s surface. There is always a distinctive region in which the height is proportional to the relative percent reflectivity

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Hyeon-Bong Pyo, Jeong Won Park, and Hyung Ju Park "Can surface plasmon resonance imaging accurately measure topographic height?", Proc. SPIE 12860, Plasmonics in Biology and Medicine XXI, 128600A (13 March 2024); https://doi.org/10.1117/12.3016200

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