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This paper discusses a methodology based on the free space depth measurement scheme facilitating the allocation of the real optical axis relative to the newly established datum resulting from the presence of a mechanical attachment. The methodology only requires depth data in one direction and the DUT does not need to be perfectly aligned with the sensor. This, in turn, enables an in-situ optical alignment capability in the mass-production environment, where position accuracy and repeatability are critical.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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