Calculation of the internal electric field distribution which are exposed to extremely high X-ray radiation doses inside the CdZnTe detectors

Xiangxiang Luo; Yue Zhang; Jing Qu; Feng Li; Chengfang Qiao; Chunsheng Zhou

doi:10.1117/12.3011208

2 November 2023 Calculation of the internal electric field distribution which are exposed to extremely high X-ray radiation doses inside the CdZnTe detectors

Xiangxiang Luo, Yue Zhang, Jing Qu, Feng Li, Chengfang Qiao, Chunsheng Zhou

Author Affiliations +

Proceedings Volume 12919, International Conference on Electronic Materials and Information Engineering (EMIE 2023); 129191O (2023) https://doi.org/10.1117/12.3011208
Event: 3rd International Conference on Electronic Materials and Information Engineering (EMIE 2023), 2023, Guangzhou,, China

Abstract

Calculated inner electric field distribution in Cd_xZn1_-xTe detector can be better applied in fields such as solar cells, infrared and ultraviolet detection, and the carrier density, space charge. The internal distribution of the electric field played an important role in the CdxZn1-xTe planar detectors. Understanding the detection characteristics of Cd_xZn_1-xTe under ultra-high X-ray flux. Ultimate outcome explanation when the roentgen ray flux is particularly above the average, there will be severe space charge accumulation and internal electric field distortion. This may seriously affect the performance of the detector.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Xiangxiang Luo, Yue Zhang, Jing Qu, Feng Li, Chengfang Qiao, and Chunsheng Zhou "Calculation of the internal electric field distribution which are exposed to extremely high X-ray radiation doses inside the CdZnTe detectors", Proc. SPIE 12919, International Conference on Electronic Materials and Information Engineering (EMIE 2023), 129191O (2 November 2023); https://doi.org/10.1117/12.3011208

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