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This study examines topological dependence of diffuse reflectance for IR absorbing materials. A theoretical foundation for this functional dependence is described, elucidating physical processes underlying topological dependence of IR diffuse reflectance of composite-material layers on substrates. The dependence is examined by case studies using composite-material layers that include IR absorbing dyes on fabric substrates. Understanding the topological dependence of diffuse reflectance can assist in determining optimal composite-material configurations for specific reflectance specifications, which can include UV protecting materials.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
J. Duncan,T. Mayo,S. Ramsey, andS. G. Lambrakos
"Topological dependence of diffuse reflectance for IR absorbing materials", Proc. SPIE 13045, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV, 1304514 (7 June 2024); https://doi.org/10.1117/12.3011628
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J. Duncan, T. Mayo, S. Ramsey, S. G. Lambrakos, "Topological dependence of diffuse reflectance for IR absorbing materials," Proc. SPIE 13045, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV, 1304514 (7 June 2024); https://doi.org/10.1117/12.3011628