Poster + Paper
16 August 2024 Reflectance measurements of mm-wave absorbers using frequency-domain continuous wave THz spectroscopy
Gaganpreet Singh, Rustam Balafendiev, Zeshen Bao, Thomas J. L. J. Gascard, Jon E. Gudmundsson, Gagandeep Kaur, Vid Primožič
Author Affiliations +
Conference Poster
Abstract
Due to high dynamic range and ease of use, continuous wave terahertz spectroscopy is an increasingly popular method for optical characterization of components used in cosmic microwave background (CMB) experiments. In this work, we describe an optical testbed that enables simultaneous measurements of transmission and reflection properties of various radiation absorbing dielectric materials, essential components in the reduction of undesired optical loading. To demonstrate the performance of the testbed, we have measured the reflection response of five absorbers commonly used for such applications: TKRAM, carbon- and iron-loaded Stycast, HR10, AN72, and an in-house 3D printed absorber across a frequency range of 100 to 500 GHz, for both S- and P-polarization, with incident angles varying from 15° to 45°. We present results on both the specular and scattered reflection response of these absorbers.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Gaganpreet Singh, Rustam Balafendiev, Zeshen Bao, Thomas J. L. J. Gascard, Jon E. Gudmundsson, Gagandeep Kaur, and Vid Primožič "Reflectance measurements of mm-wave absorbers using frequency-domain continuous wave THz spectroscopy", Proc. SPIE 13102, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XII, 131021W (16 August 2024); https://doi.org/10.1117/12.3021440
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KEYWORDS
Specular reflections

Reflection

Reflectivity

Terahertz radiation

Receivers

Photocurrent

Polarization

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