Paper
1 December 1990 Visible scatter measurements of various materials
Charles L. Schaub Jr., Mark Davis, Gary Inouye, Phillip Schaller
Author Affiliations +
Abstract
Within the Aerospace community visible wavelength scatter data from a variety of space sensor materials is not widely available. The Scatter and Off Axis Rejection Laboratory has a comprehensive data base which shows typical and state of the art scatter performance of many typical sensor materials.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles L. Schaub Jr., Mark Davis, Gary Inouye, and Phillip Schaller "Visible scatter measurements of various materials", Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); https://doi.org/10.1117/12.22670
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KEYWORDS
Bidirectional reflectance transmission function

Aluminum

Polishing

Beryllium

Scatter measurement

Space sensors

Silicon

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