Background reduction in microchannel plates

John H. Chappell; Rachel K. Martin; Stephen S. Murray; Martin V. Zombeck

doi:10.1117/12.23249

1 November 1990 Background reduction in microchannel plates

John H. Chappell, Rachel K. Martin, Stephen S. Murray, Martin V. Zombeck

Proceedings Volume 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy; (1990) https://doi.org/10.1117/12.23249
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The source of an observed diffuse, time-varying structured background component in both bare and coated microchannel plates (MPCs) is investigated. The effects of MCP operating voltages, MCP gain characteristics, pressure, electrical contacts, and physical shielding on this background component are addressed. Various techniques to reduce this background are considered.

Citation Download Citation

John H. Chappell, Rachel K. Martin, Stephen S. Murray, and Martin V. Zombeck "Background reduction in microchannel plates", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23249

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