Paper
5 February 2025 Normalized least dependent difference: a method in solving incorrectly identified monotonic linearity relationship in linear regression
Author Affiliations +
Proceedings Volume 13510, International Workshop on Advanced Imaging Technology (IWAIT) 2025; 135100U (2025) https://doi.org/10.1117/12.3057904
Event: International Workshop on Advanced Imaging Technology (IWAIT) 2025, 2025, Douliu City, Taiwan
Abstract
In machine learning, the reliability of an analytical method is crucial in validating the assumption of linearity for any linear regression model. The existing analytical method of proving the assumption linearity, such as Pearson’s Correlation Coefficient (PCC), Spearman’s Rank Correlation Coefficient (SRCC) and Kendall’s Tau Correlation Coefficient (KTCC), has its limitation as it does not work in monotonic relationship graph. In this paper, we propose a Normalized Least Dependent Difference (NLDD) method to improve the limitation of existing linearity method in identifying monotonic relationship graph. By calculating the difference between each data point and its predicted value on the regression line, we can determine how much the predicted value deviates from the observed value. A consistent difference between each data point and its predicted value, represented by a relative standard deviation in the y-axis that is near to its mean, suggests that the model accurately reflects the relationship between the dependent variable and the independent variable. Our findings show that our NLDD is effective in identifying linearity in linear relationship graph and non-linearity in monotonic relationship graph.
(2025) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Herrick Han Lin Yeap, Le Ying Lim, Michelle Chee Ern Lim, Brandon Chen Hong Chow, Hui Yan Kimberly Ong, Kok Seng Eu, and Kian Meng Yap "Normalized least dependent difference: a method in solving incorrectly identified monotonic linearity relationship in linear regression", Proc. SPIE 13510, International Workshop on Advanced Imaging Technology (IWAIT) 2025, 135100U (5 February 2025); https://doi.org/10.1117/12.3057904
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KEYWORDS
Linear regression

Data modeling

Correlation coefficients

Machine learning

Reliability

Mathematical modeling

Testing and analysis

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