Linearized ray-trace analysis

David C. Redding; William G. Breckenridge

doi:10.1117/12.47910

1 January 1991 Linearized ray-trace analysis

David C. Redding, William G. Breckenridge

Proceedings Volume 1354, 1990 Intl Lens Design Conf; (1991) https://doi.org/10.1117/12.47910
Event: 1990 International Lens Design Conference, 1990, Monterey, CA, United States

Abstract

A new, coordinate-free version of the exact ray-trace equations for optical systems consisting of conic reflecting, refracting and reference surfaces is presented. These equations are differentiated to obtain closed-form optical sensitivity dyadics. For computation, the sensitivities are evaluated in a single global coordinate frame and combined in linearized ray-trace matrix difference equations that propagate the rays and the sensitivities from element to element. One purpose of this analysis is to create optical models that can be directly integrated with models of the instrument structure and control systems for dynamic simulation.

Citation Download Citation

David C. Redding and William G. Breckenridge "Linearized ray-trace analysis", Proc. SPIE 1354, 1990 Intl Lens Design Conf, (1 January 1991); https://doi.org/10.1117/12.47910

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