Paper
1 July 1991 Application of low-noise CID imagers in scientific instrumentation cameras
Joseph Carbone, J. Hutton, Frank S. Arnold, Jeffrey J. Zarnowski, S. VanGorden, Michael J. Pilon, Mark V. Wadsworth
Author Affiliations +
Abstract
CIDTEC has developed a PC-based instrumentation camera incorporating a preamplifier per row CID imager and a microprocessor/LCA camera controller. The camera takes advantage of CID X-Y addressability to randomly read individual pixels and potentially overlapping pixel subsets in true nondestructive (NDRO) as well as destructive readout modes. Using an oxy- nitride fabricated CID and the NDRO readout technique, pixel full well and noise levels of approximately 1*106 and 40 electrons, respectively, were measured. Data taken from test structures indicates noise levels (which appear to be 1/f limited) can be reduced by a factor of two by eliminating the nitride under the preamplifier gate. Due to software programmability, versatile readout capabilities, wide dynamic range, and extended UV/IR capability, this camera appears to be ideally suited for use in spectroscopy and other scientific applications.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph Carbone, J. Hutton, Frank S. Arnold, Jeffrey J. Zarnowski, S. VanGorden, Michael J. Pilon, and Mark V. Wadsworth "Application of low-noise CID imagers in scientific instrumentation cameras", Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); https://doi.org/10.1117/12.45327
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KEYWORDS
Cameras

Imaging systems

Electrons

Optical sensors

Solid state electronics

Charge-coupled devices

Field effect transistors

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