Paper
1 December 1990 Four-port reflectometers operating at Ka- and W- bands
Nick Fourikis
Author Affiliations +
Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 15146M (1990) https://doi.org/10.1117/12.2301648
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
Four-port reflectometers measuring the amplitude of the reflection/transmission coefficients of waveguide structures have been realised at Ka- and W- bands. Their accuracy derived by using standard mismatches is excellent at Ka- band and fairly good at W- band. The reported reflectometers are precursors of six-port reflectometers.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nick Fourikis "Four-port reflectometers operating at Ka- and W- bands", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15146M (1 December 1990); https://doi.org/10.1117/12.2301648
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Cited by 1 scholarly publication.
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KEYWORDS
Waveguides

Reflectometry

Network security

Analytical research

Sensors

Analog electronics

Calibration

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