Whole field displacement and strain rosettes by grating objective speckle method

Meirong Tu; Peter J. Gielisse; Wei Xu

doi:10.1117/12.49499

1 December 1991 Whole field displacement and strain rosettes by grating objective speckle method

Meirong Tu, Peter J. Gielisse, Wei Xu

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.49499
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The grating objective speckle method was applied for whole field displacement measurements to a high transition temperature superconductor (Y Ba₂Cu₃O_x) disk under diametral-compression. Four fringe patterns were obtained from one single specklegram, indicating the displacement components along four different directions, with 45 degree intervals. The spatial frequencies, which represent the sensitivities of the fringe intervals, were 2400 lines/mm for U_x and U_y, and 1697 lines/mm for U₄₅ and U₁₃₅, respectively. The normal strain components, ε_x, ε_y, ε₄₅, and ε₁₃₅, can be directly transformed. The shear strain, γ_xy, can therefore, be calculated by the rosette equations without the need for first cross-derivatives from two displacement contour maps, which is highly sensitive to accidental rigid-body rotations. The technique provides an extremely simple set-up for the recording system. There axe no laser, no camera, no laborious optical alignment and no requirement for vibration isolation.

Citation Download Citation

Meirong Tu, Peter J. Gielisse, and Wei Xu "Whole field displacement and strain rosettes by grating objective speckle method", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49499

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